用户名: 密码: 验证码:
LED参数测量及其质量控制的研究与应用
详细信息    本馆镜像全文|  推荐本文 |  |   获取CNKI官网全文
摘要
LED参数测量和质量控制是LED封装产业中重要的环节,在应用领域内,大功率LED光源在汽车车灯上的应用是将来的必然趋势。LED的封装产业和应用领域中,存在一些难以解决的问题:如何对LED测量系统中的关键量具进行分析?如何实现在线准确测量LED的参数?如何对LED关键参数的测量过程进行质量控制?如何分析和解决大功率LED在车灯中的散热?
     本文根据最小二乘法对LED光谱测试仪的测量系统进行了研究;利用质量控制图分别对LED的主波长和光强的测量过程做质量做分析;设计了LED参数高精度在线自动测量程序;用ANSYS软件对大功率LED车灯腔体的热耦合做了分析。主要研究工作如下:
     1.提出基于最小二乘法的光谱测试仪中像位—峰值波长线性回归方程的系数求解法。根据F检验法和t检验法分别对线性回归方程做显著性检验,证明了像位—峰值波长线性回归方程的可靠实用;利用方差分析法对光谱测试仪的测量能力进行有效评估,结果显示光谱测试仪有稳定的测量能力。
     2.对LED主波长测量过程做质量控制图分析。设计了LED主波长测试方法框架图,分析了色度学参数的测量过程;对LED主波长测量过程分别用休哈特控制图和EWMA控制图进行分析,给出小偏移数据质量控制的正确分析方法。
     3.提出了趋势控制图对光强的测量过程进行质量控制。针对测试过程中的光强质量水平远好于可接受的质量水平时,提出应用平滑系数Bayes控制法可避免将合格的产品误判为不合格。根据样品均值趋势控制法,分析了光强测试过程中的误差源,并对LED光强测量系统提出改进措施。
     4.设计了LED参数在线自动测量程序。全面分析了LED参数的测量过程,设计了参数相应的LabVIEW子程序模块。提出的基于斜率单调递减的色度图四分区法,提高了测量LED参数的速度;提出的查表法,提高了LED参数的测量精度。
     5.设计了LED车灯的散热装置三维模型,并以此模型用ANSYS软件进行了LED车灯腔体在无任何散热装置、风扇散热、翅片散热器、翅片和风扇组合四种情况下的热耦合分析。
LED industrial chain is mainly composed of chip research, packaging industry and its application. The measurement of LED Parameter and its quality control are very important for LED packaging industry. For LED application. it is the inevitable trend in the future that the power LEDs is applied to the car lamps. But there are still many technical problems existed in LED packaging industry and its application:how to analyze the key measuring implements in LED measurement system, how to measure accurately LED Parameter on-line, how to control the qualities of LED key Parameter, how to analyze and solve heat dissipation of power LEDs in the car lamps.
     According to the least square method, the measurement system of LED spectrometer is researched. The measurement process of LED dominant wavelengths and intensities are analyzed by means of the quality control charts. On-line automatic measuring program with high-precision for LED Parameter is designed. Based on ANSYS software, thermal coupling in power LED lamps is analyzed. The main research works are as follows.
     1. By means of least square method, the coefficients of linear regression equation for the spectrometer phases and peak wavelengths are solved. According to the F-test and t-test, the significance of the linear regression equation is tested and the results verify the linear regression equation reliable and practical. By means of square difference analysis, the measurement capability of the spectrometer is effectively evaluated and the results verify that its measurement capability is stable.
     2. The measurement process of LED dominant wavelengths is analyzed by means of the quality control chart. The measurement framework of LED dominant wavelengths is designed, and the test process of the colorimetric parameter is analyzed totally. The measurement process of LED dominant wavelengths are analyzed according to Shewhart control chart and the EWMA (Exponentially Weighted Moving Average) control chart, and the correct analysis method for small offset data in the quality control is pointed.
     3. For the measured data of LED intensities, the smoothed-factor Bayes control method is presented to control the LED quality. The measurement characteristics and methods are analyzed for LED intensities. When LED intensity quality data in the test process are much better than the acceptable quality level, Smoothed-Factor Bayes Control Method can be recommended to avoid good products to be distinguished unqualified products. According to the trend analysis for sample mean values, the error sources in LED intensity test process are analyzed, and the improvement measures are proposed for LED intensity measurement system.
     4. On-line automatic measurement program for LED Parameter is designed. Total measurement process of LED Parameter is comprehensively analyzed, and based on LabVIEW, the corresponding modules for subprograms are also designed. In order to improve measurement speeds of LED Parameter, the chromaticity diagram is presented to divide it into4different regions according to the slopes monotonic decreasing. And in order to improve its measurement accuracy, the looking-up table method is proposed.
     5. The three-dimension model of heat-dissipation devices for LED lamps is designed. Based on ANSYS software, the thermal coupling in power LED car lamp is analyzed under four conditions such as non-heat-dissipation device, cooling fan, fin radiator, the device of fin radiator and cooling fan. As important references, the analysis results are very useful for heat dissipating arrangement design in power LED car lamp.
引文
[1]刘颂豪.21世纪的光电子产业[J].科技管理研究,2001(2):1-6.
    [2]http://www.ledinfo.cn
    [3]http://www.china-led.net
    [4]CIE127:1997.Measurement Of LEDs[S]. Vienna:CIE Central Bureau,1997.
    [5]CIE 127:2007. Measurement Of LEDs [S].Vienna:CIE Central Bureau,2007.
    [6]A A Gaertner. LED Measurement Issues[C].Technical Report of Institute for National Measurement Standards National Research Council of Canada, Canada,2002,1-17.
    [7]P Blanco, A Cifuentes, J Arasa, et al. Efficient LED spatial measurement to improve optical modeling[J]. Proceedings of SPIE,2007,147-151.
    [8]Qu Xiaohui, Wong Siu Chung, Tse Chi K. Color control system for RGB LED light sources using junction temperature measurement[C].Proceedings of the 33rd Annual Conference of the IEEE Industrial Electronics Society,Taibei,2007,1363-1368.
    [9]Ferhat S. Influence of the Spectral Power Distribution of a LED on the Illuminance Responsivity of a Photometer [J]. Optics and Lasers in Engineering,2008,46(6):643-647.
    [10]金尚忠,王东辉,周文,张在宣.发光二极管光谱参数测试方法的研究[J].光电子.激光,2002,13(8),825-827.
    [11]鲍超.发光二极管测试技术和标准[J].物理,2003,32(5):319-324.
    [12]潘建根,岳红轩,沈海平等.分光法测量LED颜色的不确定度分析[J].光电子.激光,2008,19(2),149-151.
    [13]邹建,曾甜玲,刘婧娟.基于线阵CCD的LED光功率及发散角的自动测试[J].压电与声光,2009,31(1),109-111.
    [14]王巧彬,任豪,罗宇强等.基于LabVIEW的LED光源特性检测系统的研制[J].发光学报,2009,30(4),509-514.
    [15]潘建根,李倩.LED灯具性能的表征与测量问题探讨[C].海峡两岸第十六届照明科技与营销研讨会,太原,2009,89-95.
    [16]Eagle A R. A Method for Handling Errors in Testing and Measuring[J].Industrial Quality Control,1954,3:10-14.
    [17]Grubbs F E. Error of Measurement Precision Accuracy and the Statistical Comparison of Measuring Instruments [J].Technometrics,1973,15(2):53-56.
    [18]Mandel J. Repeatability and Reproducibility [J].Journal of Quality Technology,1972,4(2): 74-85.
    [19]Automotive Industry Action Group. Measurements Systems Analysis [M].Detroit,2002.
    [20]K D Majeskea, R W Andrewsa. Evaluating measurement systems and manufacturing processes using three quality measures[J].Quality Engineering,15(2),2002,243-251.
    [21]Richard K, Burdick, Connie M, et al. A Review of Methods for Measurement Systems Capability Analysis[J].Journal of Quality Technology,2003.35(4):342-354.
    [22]Jeh-Nan Pan.Determination of the optimal allocation of parameters for gauge repeatability and reproducibility study[J]. International Journal of Quality & Reliability Management, 2004,21 (6):672-682.
    [23]W H Woodall, Connie M. et al. Some Relationships Between Gage R&R Criteria [J].Quality and Reliability Engineering International.2008,24:99-106.
    [24]何桢,生静,施亮星.测量系统的R&R分析在企业质量改进中的应用[J].工业工程.2003.6(1):62-66.
    [25]马义中.徐颖强.测量系统波动源的分析、控制和软件设计[J].机械科学与技术,2002,21(1):92-93.
    [26]岳刚,马义中.利用主成分分析分离测量过程中的波动源[J].工业工程与管理,2008,13(3):37-41.
    [27]N R Farnum. Control Charts for Short Runs:Nonconstant Process and Measurement Error[J].Journal of Quality Technology,1992.24(3):138-142.
    [28]W L Kenneth, H W William. Effect of measurement error on Shewhart control charts[J] Journal of Quality Technology,2001.33(2):213-216.
    [29]Nuland Y V. Do you have doubts about the measurement Result, too?[J].Quality Engineering,1993,6(1):99-133.
    [30]D P Mader, J Prins, R E Lampe.The Economic Impact of Measurement Error[J].Quality Engineering.1999(11):563-574.
    [31]Steiner. Statistical process control using two measurement systems[J]. Technometrics, 2000,42(2):179-187.
    [32]Hsin-Hung Wu, James J. Swain.A Monte Carlo comparison of capability indices when processes are non-normally distributed[J].Quality and Reliability Engineering International, 2001,17(3):219-231.
    [33]Silvano B, Michele S. Statistical Analysis of Process Capability Indices With Measurement Errors[J].Quality and Reliability Engineering International,2002,18:321-332.
    [34]孙静,张公绪.常规控制图标准及其应用[M].北京:中国标准出版社2000.
    [35]李益兵.光电子产品生命周期质量管理关键技术研究[博士学位论文].武汉:武汉理工大学,2009.
    [36]MacGregor J F, Kourti T. Statistical process control of multivariate processes[J].Control Eng. Practice,1995,3(3):403-414.
    [37]钟伦燕,韩俊,刘红.统计过程控制(SPC)技术原理和应用[M].北京:电了工业出版社2001.
    [38]Perry M B, Spoerre J K, Velasco T. Control Chart Pattern Recognition Using Back Propagation Artificial Neural Networks[J]. International Journal of Production Research.2001,39(15):339-341.
    [39]陆兵.浅论SPC的应用[J].世界标准化与质量竹理,2001,(5):18-21.
    [40]淑荣,梁工谦,彭炎午.先进制造系统中的统计过程控制[J].航空工程2000,4:12-14.
    [41]柴邦衡,吴江全.IS09001:2000质量管理体系文件[M].机械工业出版社,2002.
    [42]张公绪,孙静.统计过程控制与诊断[J].质量与可靠性.2002,6:44-47.
    [43]Page E S. Continuous Inspection Schemes[J]. Biometrika,1954,42(2):100-114.
    [44]Molnau W E. A Program for ARL calculation for multivariate EWMA chart[J]. Journal of Quality Technology,2001.33(4):515-521.
    [45]Calzda M E, Scariano SM.Reconciling the integralequat ion and Markov chain approaches for computing EWMA average run lengths[J].Communications in Statistics,2003, 32(2):591-604.
    [46]Aparisi F, Garcia-Diaz J C. Design and optimization of EWMA control charts for in-control, indifference,and Out-of-control regions[J].Computers & Operations Research,2008, 34(2):172-176.
    [47]Chao Y C, Jui C C, Wei T L. Economic design of variable sampiing intervals EWMA charts with sampling at fixed times using genetic algorithms[J].Expert Systems with Applications, 2008.34(1):419-426.
    [48]Page E. S. Controlling the standard deviation by CUSUM and warming lines[J]. Technometries,1963,5(3):307-315.
    [49]Roberts S.W. Control chart tests based on geometric moving averages[J]. Technometrics, 1959,1(2):239-250.
    [50]Worthem, A. W. Heinrich, G. P. And Taylor, D. Adaptive Exponentially Smoothed Control Charts, International Journal of Production Research,1974,12(6):683-690.
    [51]Chern Hsoon NG, Case K. E. Development and evaluation of Control Charts Using Exponentially Weighted Moving Averages[J].Journal of Quality Technology, 1989,(21)4:242-250.
    [52]Crowder S V, Hamilton M D. An EWMA for monitoring a process standard deviation [J].Journal of Quality Technology,1992,24(1):12-21.
    [53]Lucas J M, Saecucci M S. Exponentially weighted moving average control schemes: properties and enhancements [J].Technometrics,1990,32(1):1-12.
    [54]王海宇,徐济超,杨剑锋等.平稳自相关过程的EWMA控制图[J].工业工程,2006,9(3):80-83.
    [55]薛丽.基于田口质量损失函数的非正态EWMA控制图优化设计[J].工业工程.2011,14(5):75-78.
    [56]何曙光,何桢,齐二石.基于马尔可夫链模型的EWMA控制图性能分析与优化[J].系统工程与电子技术,2008,30(6):1127-1130.
    [57]殷建军,余忠华,吴昭同等.面向零件成组加工的EWMA控制图及其性能分析[J].系统工程理论与实践,2004,24(9):61-64.
    [58]袁哲俊,徐翀,马玉林.面向AMT生产环境的EWMA质量控制图[J].哈尔滨工业大学学报,2000,32(1):45-47.
    [59]俞磊,刘飞.EWMA控制图在MSA稳定性分析中的应用[J].系统工程学报,2008,23(3):381-384.
    [60]王明华,周渊,李爱平等.一种IP可追踪性的网络流量异常检测方法[J].南京邮电大学学报(自然科学版),2009.29(3):1-6.
    [61]Vera do Carmo C. de Vargas, Luis Felipe Dias Lopes, Adriano Mendonca Souza. Compararive study of the performance of the Cusum and EWMA control charts[J].Computers & Industrial Engineering,2004,46(4):707-724.
    [62]Crosier R B.A new two-sided cumulative sum quality control scheme[J]. Technometrics, 1986,28(3):187-194.
    [63]Ryan T P, Ryan A. Statistical Methods for Quality Improvement [M].New York:John Wiley&Sons,1989.
    [64]何桢,雷毅,生静等CUSUM控制图在空调充氟生产过程中的应用研究.2000,3(4):24-26.
    [65]Hawkins. Multivariate quality control based on regression-adjusted variables[J]. Technometries,1991,33 (1):61-75.
    [66]Lowry C A, Woodall W H., Champ C W, et al. A multivariate exponentially weighted moving average control chart[J].Technometrics,1992,34(1):46-53.
    [67]M. S. Srivastava, Yanhong Wu.Comparison of EWMA, CUSUM and Shiryayev-Roberts Procedures for Detecting a Shift in the Mean[J].The Annals of Statistics,1993,21(2):645-670.
    [68]牛占文.陈天骏.刘笑男.多品种小批量生产的SPC应用研究[J].工业工程,2010,13(4):100-103.
    [69]钱夕元,荆建芬,侯旭暹.统计过程控制(SPC)及其应用研究[J].计算机工程,2004,30(19):144-145.
    [70]田学民,曹玉苹.统计过程控制的研究现状及展望[J].中国石油大学学报(自然科学版),2008,32(4):]75-179.
    [71]LIANG Jun, QIAN Jixin. Multivariate statistical process monitoring and control:recent developments and applications to chemical industry[J].Chinese Journal of Chemical Engineering,2003,11 (2):191-203.
    [72]张公绪.两种质量诊断理论及其应用[M].北京:科学出版社,2001.
    [73]孙静.质量管理学(第3版)[M].北京:高等教育出版社,2011.
    [74]Montgomery D C. Introduction to Statistical Quality Control[M]. New York:John Wiley,2001.
    [75]William H, Woodall. Controversies and Contradictions in Statistical Process Control [J]. Journal of Quality Technology,2000,32(4):341-350.
    [76]梁静.LED车灯:照亮前程[J].时代汽车,2008(4),103-105.
    [77]屠其非,周莉.LED前照灯离我们有多远?[J]照明工程学报,2008,19(1):56-57.
    [78]http://www.ledsmagazine.com
    [79]Hamada M, Weerahandi S. Measurement System Assessment Via Generalized Inference [J].Journal of Quality Teehnology.2000,32(3):241-253.
    [80]蒋敏兰.测量系统精度损失溯源与预测模型研究[博士学位论文].合肥:合肥工业大学,2007.
    [81]J.Martin B, Douglas G. Measurement error [J]. British Medical Journal,1996, (313):744-753.
    [82]张黎.R&R分析对过程能力的影响河南大学学报,2005,35(2),19-21.
    [83]Tsai P. Variabie Gauge Repeatabiiity and Reproducibiiity Study Using The Anaiysis Of Variance Method [J]. Quality Engineering,1988,1(1):107-115.
    [84]施亮星.计量型测量系统能力及其评价方法研究[博士学位论文].天津:天津大学,2008.
    [85]上海质量研究院.六西格玛核心教程[M].北京:中国标准出版社,2002.
    [86]Kane V E. Process capability indices[J].Journal of Quality Technology,1986,18:41-52.
    [87]张公绪,孙静.新编质量管理学[M].北京:高等教育出版社,2003.
    [88]李海青,黄志尧.软测量技术原理及应用[M].北京:化学工业出版社,2000.
    [89]张波,陈武耕,郑红军.关于产品质量的内涵、特性及指标体系研究.学术研究[J].2001(10):44-46.
    [90]游十兵,余艳琴.统计学[M].武汉:武汉大学出版社,2001.
    [91]薛薇.统计分析与SPSS的应用[M].北京:中国人民大学出版社,2001.
    [92]Vance. A bibliography of statistical quality control chart techniques,1970-1980[J].Journal of Quality Technology,1983,15(1):59-62.
    [93]L K Chan, H L Cui. Skewness correction and R charts for skewed distributions[J].Naval Research Logistics,2003,50:555-573.
    [94]李跃波,周树民,吴海英.加权方差X-R控制图[J].武汉工业大学学报,2000,22(2):92-94.
    [95]LIN Wei-guo, LIU Yi, YANG Ming-zhong. Automatic Measurement of LED Colorimetric Parameters Based on LabVIEW[J]. Journal of Donghua University (Eng. Ed.),2011,28(6), 580-584.
    [96]Rafael C, Gonzalez, Richard E, Woods. Digital Image Processing [M].北京:电子工业出版社,2007.
    [97]安毓英,曾小东.光学传感与测量[M].北京:电子工业出版社,2001.
    [98]刘蓬军,王安祥,宋鹏等.利用光栅光谱仪测量获取物体表面的色度特性[J].现代电子技术,2009,32(23),121-123.
    [99]盛骤,谢式千,潘承毅.概率论与数理统计[M].北京:高等教育出版社,2003.
    [100]费业泰.误差理论与数据处理(第四版)[M].北京:机械工业出版社,2000.
    [101]吴石林.误差分析与数据处理[M].北京:清华大学出版社.2010.
    [102]http://www.minitab.com
    [103]S W Brown, C Santana, G. P Eppeldauer. Development of a tunable LED-based colorimetric source [J]. Res. Natl. Inst. Stand. Technol.,2002,107(4,):363-371.
    [104]范学良.辐射光谱辨识的原理研究与应用[博士学论文].合肥:中国科学技术大学,2007.
    [105]Nguyen F, Terao B, Laski J. Realizing LED illumination lighting applications [J]. Proc SPIE 2005:31-36.
    [106]Kaminski MS, Garcia KJ, Stevenson MA, Frate M, Koshel RJ. Advanced topics in source modeling [J]. Proc SPIE 2002,:46-57.
    [107]F.K. Yam, Z. Hassan. Innovative advances in LED technology [J]. Microelectronics Journal,2005,36:129-137.
    [108]K.Suzuki, K.Kohmoto, Y.Nakagawa, et al, Round Robin LED photometry test in Japan [C], Proc. of the 2nd CIE expert symposium on LED measurement, Gaithersburg, Maryland, USA,May 2001:11-13.
    [109]Liang Feng-wei, Mou Tong-shen. Discussion about problems in measuring photometric and colorimetric parameters of LED [J]. OPTICAL INSTRUMENTS of China,2005,2(27):2-7.
    [110]CHEN Huan-ting, LU Yi-jun, GAO Yu-lin et al. Optimized Algorithm for Determining Dominant Wavelength of LED [J]. ACTA METROLOGICA SINICA of China,2007,28(4): 321-328.
    [111]Yoshi Ohno. CIE fundamentals for color measurements [C], Paper for IS&T NIP16 conference, Vancouver, Canada:16-20.
    [112]胡威捷,汤顺青,朱正芳.现代颜色技术原理及应用[M].北京:北京理工大学出版社,2007.
    [113]Liu Xiaohong,Wang Zhaojun.The CUSUM Control Chart for the Autocorrelated Data with Measurement Error[J]. Chinese Journal of Applied Probability and Statistics,2009, 25(5):461-474.
    [114]孙静.接近零不合格过程的质量控制[M].北京:清华大学出版社,2001.
    [115]Hunter J S. The Exponentially Weighed Moving Average [J]. Journal of Quality Technology.1986.18:203-210.
    [116]杨德清,康娅.LED及其工作应用[M].北京:人民邮电出版社,2007.
    [117]QIN Lan, LV Yun-ri. DENG Wei-li. Design and control of multi-factors measurement system for LED [J].Measurement Control Technology and Instrument of China,2008,34(7): 78-81.
    [118]Xiaoli Zhou. Muqing Liu, Yong Qian,et al, Study on a system for LED's photometric and colorimetric measurement based on a multi-channel spectrometer [J], WSEAS TRANSACTIONS on ELECTRONICS,2008,5(12):457-467.
    [119]Kamt, S. J.A Smoothed Bayes Control Procedure for the Control of a Variable Quality Characteristic with Linear Shift. Journal of Quality Technology,1976,8(2):98-104.
    [120]http://www.ni.com/labview/zhs/
    [121]Robert H.Bishop.LabVIEW7实用教程[M].北京:电子工业出版社.2005.
    [122]赖永泉,王毅,曹银强.基于DLL的虚拟仪器系统开发技术[J].自动化技术与应用,2005,4:62-65.
    [123]林卫国,郭顺生,杨明忠.基于查表法的LED色度学参数测试方法研究[J].武汉理工大学学报,2011,33(12),93-96.
    [124]王声学,吴广宁,蒋伟等.LED原理及照明应用[J].灯与照明,2006(04):32-35.
    [125]吴仍茂,屠大维,黄志华等.一种LED汽车前照近光灯配光设计方案[J].光子学报,2009,38(11),2904-2907.
    [126]机械工业部.GB4599—94.汽车前照大灯配光性能[S].北京:机械工业部,1996.
    [127]戴锅生.传热学[M].北京:高等教育出版社,2008.
    [128]林卫国,刘依,李转生,杨明忠.功率型LED车灯建模设计及热耦合分析[J].机械与电子,2012(1).32-36.
    [129]Arik M, Petroski J, Weaver S.Thermal challenges in the future generation solid state lighting application:light emitting diodes[C], IEEE 8th intersociety Conference on Thermal and Thermommechanical Phenomena in Electronic Systems,2002,113-1202.
    [130]张朝晖ANSYS热分析教程与实例解析[M].北京:中国铁道出版社,2005.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700