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不同基底对等离子体射流放电及薄膜特性的影响
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  • 英文篇名:Effect of Different Substrates on Plasma Jet Discharge Characteristics and Thin Film Properties
  • 作者:王瑞 ; 张鹏浩 ; 徐晖 ; 章程 ; 李挺 ; 邵涛
  • 英文作者:WANG Ruixue;ZHANG Penghao;XU Hui;ZHANG Cheng;LI Ting;SHAO Tao;Key Laboratory of Power Electronics and Electric Drive, Institute of Electrical Engineering, Chinese Academy of Sciences;School of Electrical Engineering, Zhengzhou University;School of Energy and Power Engineering, Beihang University;
  • 关键词:等离子体射流 ; 不同基底 ; 射流发展过程 ; OH分布 ; 薄膜特性
  • 英文关键词:plasma jet;;different substrates;;plasma jet development process;;OH distribution;;thin film properties
  • 中文刊名:GDYJ
  • 英文刊名:High Voltage Engineering
  • 机构:中国科学院电工研究所电力电子与电气驱动重点实验室;郑州大学电气工程学院;北京航空航天大学能源与动力工程学院;
  • 出版日期:2019-05-28
  • 出版单位:高电压技术
  • 年:2019
  • 期:v.45;No.318
  • 基金:国家自然科学基金(11575194;51877205);; 清华大学电力系统及大型发电设备安全控制和仿真国家重点实验室开放课题(SKLD17KM06)~~
  • 语种:中文;
  • 页:GDYJ201905003
  • 页数:7
  • CN:05
  • ISSN:42-1239/TM
  • 分类号:23-29
摘要
等离子体材料表面处理包括等离子体–基底相互作用过程,绝缘或金属基底的存在会改变等离子体放电和化学气相沉积过程,进而影响沉积薄膜特性。为此重点研究大气压等离子体射流薄膜沉积体系中,等离子体射流激发态粒子和基态OH浓度发展规律,并进一步将等离子体射流放电过程与薄膜特性建立联系。结果表明:薄膜沉积过程中,检测到Ar、N2以及OH相关谱线,有机玻璃(PMMA)基底时谱线强度略高;对于OH自由基的相对密度分布,当基底为PMMA时主要分布在管口附近,而当基底为铜(Cu)时分布在管口与基底间的整个空间区域,并且TEOS的含量增加使得其分解形成的中间产物增加,进而增加薄膜沉积速率。此外,不同的材料会造成靠近基底处的场强有较大差异,如PMMA基底处场强基本维持不变,而Cu基底处场强有所增加。通过对薄膜成分分析和对比,发现PMMA表面沉积的薄膜氧化程度更高且所含的杂质较少。通过对不同基底上沉积薄膜以及沉积过程的对比和诊断,对于理解并解决在应用中的相关问题具有重大意义。
        Materials surface modification by plasma involves plasma-substrates interaction. The existence of insulation or metal substrate will change the plasma discharge and chemical vapor deposition process. Consequently, we investigated the influences of different substrates(insulation or metal) on the distribution of active particles and ground state OH, and established a relationship between plasma jet discharge process and film characteristics. The results show that the plasma jet exhibits different characteristics near the substrate during film deposition. The optical emission of Ar, N2 and OH with a higher intensity is observed on the PMMA substrate. The OH free redical mainly distributes near the nozzle when the substrate is PMMA, and distributes in the whole space area between the nozzle and the substrate when the substrate is Cu The increase of TEOS content leads to the increase of the number of intermediate products formed by the decomposition of TEOS, which in turn increases the deposition rate of the films. In addition, the field intensity near the substrate varies with different materials. For example, the field intensity near the PMMA substrate remains basically unchanged while near the Cu substrate it increases. By analyzing and comparing the composition of the films, it is found that the films deposited on PMMA surface have higher oxidation degree and less impurities. Furthermore, by comparing and diagnosing the deposition process of thin films on different substrates, it is of great significance to understand and solve the problems in engineering applications.
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