X-ray Photoelectron Spectroscopy of Isolated Nanoparticles

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• 作者：Olivier Sublemontier ; Christophe Nicolas ; Damien Aureau ; Minna Patanen ; Harold Kintz ; Xiaojing Liu ; Marc-Andr茅 Gaveau ; Jean-Luc Le Garrec ; Emmanuel Robert ; Flory-Anne Barreda ; Arnaud Etcheberry ; C茅cile Reynaud ; James B. Mitchell ; Catalin Miron
• 刊名：The Journal of Physical Chemistry Letters
• 出版年：2014
• 出版时间：October 2, 2014
• 年：2014
• 卷：5
• 期：19
• 页码：3399-3403
• 全文大小：252K
• ISSN：1948-7185

文摘

X-ray photoelectron spectroscopy (XPS) is a very efficient and still progressing surface analysis technique. However, when applied to nano-objects, this technique faces drawbacks due to interactions with the substrate and sample charging effects. We present a new experimental approach to XPS based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system. The structure of the Si/SiO₂ interface was probed without any substrate interaction or charging effects for silicon nanocrystals previously oxidized in ambient air. Complete characterization of the surface was obtained. The Si 2p core level spectrum reveals a nonabrupt interface.

Keywords:

X-ray Photoelectron Spectroscopy; Silicon Nanocrystals; Isolated Nanoparticles; Si/SiO₂ interface; Nanocharacterization; Synchrotron Radiation