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片内互连频变电磁参数(R和L)提取及软件的制作
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摘要
互连封装结构的电特性对当前高速电路系统的总体性能具有
    至关重要的作用。本论文主要针对高速集成电路片内互连的结构
    进行了电磁参数的提取,并在此基础上开发了一个用于片内互连
    频变电磁参数(R和L)提取的软件。该软件界面简洁友好,功
    能强大,易于操作,适于工程应用。
     本文的工作主要如下:第二章介绍了电磁参数提取方法,第
    三章介绍了软件的设计及使用方法,第四章介绍了一些软件应用
    实例,并将结果与文献或其它软件的结果进行了比较。
The electric properties of interconnects and packaging are very
     important for the performance of high-speed integrated circuits. This
     thesis is oriented for the electronic modeling and parameters
     extraction of on-chip interconnects. A software is developed for the
     extraction of the frequency-dependent parameters R and L under such
     circumstance. It抯 user-friendly, powerful and easy for engineering
     application.
    
     The contents are arranged as followings: In chapter two, the method of
     electromagnetic parameters extraction is introduced; Chapter three
     illustrates how the software was designed and how to use it; In
     chapter four, results for various interconnects are compared with those
     given in the literatures or by other softwares.
引文
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