光学系统可见光透过率测试技术研究
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摘要
本论文主要研究光学系统可见光透过率测试方法。透过率反应了经过光学系统的光线能量的损失情况。本系统基于互相关检测技术,采用双通道原理进行,光电检测技术进行可见光的透过率测试。和以往的单通道法检测相比,能有效抑制背景噪声和1/f噪声。系统可工作在亮场条件下,并同时对双通道进行检测,测量方便且精度高。而且,通过计算机软硬件实现对测量结果的实时监测和后期处理。系统测试精度达到1%。
本论文介绍了上述系统的总体结构;并对各分系统进行原理叙述;设计照明系统,并对斩光器进行改进,消除其带来的测量误差;通过对校正滤光片、光电池和光纤的选配及各分系统的合理搭配构建了测试系统。并为后续研究作了理论铺垫。
The Optical capability of visible light transmittance is studied on this paper. The Transmittance responded the loss situation in light energy crossing optical system. The system is based on the principle of cross-correlation detection, and measure the transmittance of visible light Optical system though the way of dual-channels, and photo electricity examination technology to carry on the visible light transmittance test. Compare to the previous way, eliminate the background error in measuring many times, and restrainthe 1/f noise signal more effectively. in addition, the whole system can work on theconditions of light field. Meanwhile, test the double channel signals at the same, thus, its convenience and high-precision. And monitoring and dealing with the result in real-time. The testing accuracy reaches 1%.
The present paper has studied the overall structure mentioned above; and narrate the Principle of each sub-divided system; Design the lighting system, and make the improvement to the light chopper, eliminates measuring error; through to adjusted the light filter, the solar battery and the optical fiber selects and matches various subsystems reasonably to construct the whole test system. And make the theory basic for the following research.
本论文介绍了上述系统的总体结构;并对各分系统进行原理叙述;设计照明系统,并对斩光器进行改进,消除其带来的测量误差;通过对校正滤光片、光电池和光纤的选配及各分系统的合理搭配构建了测试系统。并为后续研究作了理论铺垫。
The Optical capability of visible light transmittance is studied on this paper. The Transmittance responded the loss situation in light energy crossing optical system. The system is based on the principle of cross-correlation detection, and measure the transmittance of visible light Optical system though the way of dual-channels, and photo electricity examination technology to carry on the visible light transmittance test. Compare to the previous way, eliminate the background error in measuring many times, and restrainthe 1/f noise signal more effectively. in addition, the whole system can work on theconditions of light field. Meanwhile, test the double channel signals at the same, thus, its convenience and high-precision. And monitoring and dealing with the result in real-time. The testing accuracy reaches 1%.
The present paper has studied the overall structure mentioned above; and narrate the Principle of each sub-divided system; Design the lighting system, and make the improvement to the light chopper, eliminates measuring error; through to adjusted the light filter, the solar battery and the optical fiber selects and matches various subsystems reasonably to construct the whole test system. And make the theory basic for the following research.
引文
1 范志纲 主编。光电测试技术。北京:电子工业出版社,2004:33-41
2 《光学测量与仪器》编辑组 编。光学测量与仪器。北京:国防工业出版社,1978:745-746
3 光学仪器设计手册。北京:国防工业出版社,1976
4 邓锦辉,高岳。光纤面板透过率分布检测方法 北京理工大学信息科学技术学院。北京光学技术第31卷 第4期2005年7月
5 杨志文等编著。光学测量。北京:北京理工大学出版社。1995:268-281
6 陈佳圭编著。微弱信号检测。中央广播电视大学出版社。1997:10
7 吴杰编。光电信号检测。哈尔滨工业大学出版社。1990:37-58,67-76
8 王之江。光学设计理论基础。第二版,北京:科学出版社,1985:216-217
9 赵远,张宇主编。光电信号检测原理与技术。机械工业出版社2005:36-46,172-181
10 雷玉堂,王庆有,何加铭,张伟风编著。光电检测技术。中国计量出版社。1996:153-157,183-197调制266-269锁相放大器
11 叶嘉雄,常大定,陈汝钧编著。光电系统与信号处理。科学出版社。1997:272-321
12 J un Zhang,Guanchang Jin,Shaopeng Ma,et al.Application of an improved sub pixel registration algorithm on digital speckle correlation measurement[J].Optics & Laser Technology,2003,35:533-542.
13 安连生,应用光学,北京理工大学出版社,2000
14 《计量测试技术手册》编辑委员会。计量测试技术手册 第10卷 光学。北京:中国计量出版社,1997年2月第一版
15 Lax M,Burstein E.A review on the recent study development of materials physics[J].Phys.Rev.1955,97:39.
16 Schieber M,Schlesinger T E,James R B,et al.Study of impurity segregation,crystallinity,and detector performance of meltgrown cadmium zinc telluride crystals[J].J.Crystal Growth,2002,237-239:2082-2090.
17 James R B,Brunett B,Heffelinger J,et al.Material properties of large volume CZT crystals and their relationship to nuclear detector performance[J].J.Electron.Mater.,1998,27:788-799.
18 Sanaghamitra S,David R,Charles R,et al.Extraction of mobile impurities from CdZnTe[J].
20 高稚允,高岳编著。光电检测技术。北京:国防工业出版社。1995:120-147,380-324
21 唐鸿宾等。N D系列可变频率双参考斩光器“数据采集与处理”。南京航空航天大学出版社。1989:110
22 曾庆勇编著。微弱信号检测。浙江大学出版社。1993:47-107
23 Meade ML.Advances in amplifiers[J].JphysE SciIn strum,1982:15
24 CdZnTe crystals[J].J.Electron.Mater.,1999,No.4 Aug.2003,28:683-689
25 南京大学信息物理系编。弱信号检测技术。高等教育出版社。1991:1-5
26 吴泽言。光电信号的微机处理技术。北京:北京工业学院。1987
27 Sutton M A,McNeill S R,Helm J D,et al.Advances in two-dimensional and three-dimensional computer vision[M].Berlin:Springer,1999.
28 刘钧,高明编著。光学设计。西安电子科技大学出版社。2006:182-201,46-47
26 吴泽言。光电信号的微机处理技术。北京:北京工业学院。1987
27 Sutton M A,McNeill S R,Helm J D,et al.Advances in two-dimensional and three-dimensional computer vision[M].Berlin:Springer,1999.
29 袁旭仓。光学设计。北京理工大学出版社。1995:244-255
30 李士贤,李林编。光学设计手册。北京理工大学出版社。1995:283
31 Neil I.A.Optimization glitches in zoom lens design[J].SPIE,1997,3129:158-180.
32 T.O ZAWA,Applied Optics,1988,27(5):802.
33 钱铮,张昌陆。参考输出占空比可调的双光路斩光器。第18卷,第3期,苏州丝绸工学院学报。1998年6月
34 张昌陆等。双频微机控制数字锁相检测系统。苏州丝绸工学院学报。1994
35 Vendroux G,Knauss W G.Submicron.deformation field measurements:part Ⅲ,demonstration of deformation determination[J].Exp Mech,1998,38:154-160.
36 王因明主编。光学计量仪器设计。北京:机械工业出版社。1982
37 Sutton M A,McNeill S R,Jang J,et al.Effects of subpixel image restoration on digital correlation error estimation[J].Opt Eng,1988,27(10):870-877.
38 何照才。光学测量系统[M]。北京:国防工业出版社。2002:163-164
39 萧泽新,安连生。工程光学设计[M]。北京:电子工业出版社,2003
40 浦昭邦主编。光电测试技术。机械工业出版社。39-42,63-70
41 卢春生编著。光电探测技术及应用。机械工业出版社。1992:13
42 Koyama A,Hichiwa A,Hirano R.Recent progress in SEMICONDUCTOR OPTOELECTRONICS
43 Fiederle M,Feltgen T,Meinhardt J,et al.State of the art of CdZnTe as Gamma detectors[J].J.CrystalGrowth,1999,197:635-640
44 费业泰。误差理论与数据处理。北京:机械工业出版社。1995:34-54
45 Peters W H,Ranson W F.Digital imaging techniques in experimental stress analysis[J].Opt Eng,1981,21:427-431
46 Schreier W S,Braasch J R,Sutton M A.Systematic errors in digital image correlation caused by intensity interpolation[J].optEng,2000,39(11):2915-2921.
47 强西林,高鸣,卢进军。便携式镀膜玻璃光学透过率测定仪。西安工业学院,应用光学。第16卷 第1期 1995年
2 《光学测量与仪器》编辑组 编。光学测量与仪器。北京:国防工业出版社,1978:745-746
3 光学仪器设计手册。北京:国防工业出版社,1976
4 邓锦辉,高岳。光纤面板透过率分布检测方法 北京理工大学信息科学技术学院。北京光学技术第31卷 第4期2005年7月
5 杨志文等编著。光学测量。北京:北京理工大学出版社。1995:268-281
6 陈佳圭编著。微弱信号检测。中央广播电视大学出版社。1997:10
7 吴杰编。光电信号检测。哈尔滨工业大学出版社。1990:37-58,67-76
8 王之江。光学设计理论基础。第二版,北京:科学出版社,1985:216-217
9 赵远,张宇主编。光电信号检测原理与技术。机械工业出版社2005:36-46,172-181
10 雷玉堂,王庆有,何加铭,张伟风编著。光电检测技术。中国计量出版社。1996:153-157,183-197调制266-269锁相放大器
11 叶嘉雄,常大定,陈汝钧编著。光电系统与信号处理。科学出版社。1997:272-321
12 J un Zhang,Guanchang Jin,Shaopeng Ma,et al.Application of an improved sub pixel registration algorithm on digital speckle correlation measurement[J].Optics & Laser Technology,2003,35:533-542.
13 安连生,应用光学,北京理工大学出版社,2000
14 《计量测试技术手册》编辑委员会。计量测试技术手册 第10卷 光学。北京:中国计量出版社,1997年2月第一版
15 Lax M,Burstein E.A review on the recent study development of materials physics[J].Phys.Rev.1955,97:39.
16 Schieber M,Schlesinger T E,James R B,et al.Study of impurity segregation,crystallinity,and detector performance of meltgrown cadmium zinc telluride crystals[J].J.Crystal Growth,2002,237-239:2082-2090.
17 James R B,Brunett B,Heffelinger J,et al.Material properties of large volume CZT crystals and their relationship to nuclear detector performance[J].J.Electron.Mater.,1998,27:788-799.
18 Sanaghamitra S,David R,Charles R,et al.Extraction of mobile impurities from CdZnTe[J].
20 高稚允,高岳编著。光电检测技术。北京:国防工业出版社。1995:120-147,380-324
21 唐鸿宾等。N D系列可变频率双参考斩光器“数据采集与处理”。南京航空航天大学出版社。1989:110
22 曾庆勇编著。微弱信号检测。浙江大学出版社。1993:47-107
23 Meade ML.Advances in amplifiers[J].JphysE SciIn strum,1982:15
24 CdZnTe crystals[J].J.Electron.Mater.,1999,No.4 Aug.2003,28:683-689
25 南京大学信息物理系编。弱信号检测技术。高等教育出版社。1991:1-5
26 吴泽言。光电信号的微机处理技术。北京:北京工业学院。1987
27 Sutton M A,McNeill S R,Helm J D,et al.Advances in two-dimensional and three-dimensional computer vision[M].Berlin:Springer,1999.
28 刘钧,高明编著。光学设计。西安电子科技大学出版社。2006:182-201,46-47
26 吴泽言。光电信号的微机处理技术。北京:北京工业学院。1987
27 Sutton M A,McNeill S R,Helm J D,et al.Advances in two-dimensional and three-dimensional computer vision[M].Berlin:Springer,1999.
29 袁旭仓。光学设计。北京理工大学出版社。1995:244-255
30 李士贤,李林编。光学设计手册。北京理工大学出版社。1995:283
31 Neil I.A.Optimization glitches in zoom lens design[J].SPIE,1997,3129:158-180.
32 T.O ZAWA,Applied Optics,1988,27(5):802.
33 钱铮,张昌陆。参考输出占空比可调的双光路斩光器。第18卷,第3期,苏州丝绸工学院学报。1998年6月
34 张昌陆等。双频微机控制数字锁相检测系统。苏州丝绸工学院学报。1994
35 Vendroux G,Knauss W G.Submicron.deformation field measurements:part Ⅲ,demonstration of deformation determination[J].Exp Mech,1998,38:154-160.
36 王因明主编。光学计量仪器设计。北京:机械工业出版社。1982
37 Sutton M A,McNeill S R,Jang J,et al.Effects of subpixel image restoration on digital correlation error estimation[J].Opt Eng,1988,27(10):870-877.
38 何照才。光学测量系统[M]。北京:国防工业出版社。2002:163-164
39 萧泽新,安连生。工程光学设计[M]。北京:电子工业出版社,2003
40 浦昭邦主编。光电测试技术。机械工业出版社。39-42,63-70
41 卢春生编著。光电探测技术及应用。机械工业出版社。1992:13
42 Koyama A,Hichiwa A,Hirano R.Recent progress in SEMICONDUCTOR OPTOELECTRONICS
43 Fiederle M,Feltgen T,Meinhardt J,et al.State of the art of CdZnTe as Gamma detectors[J].J.CrystalGrowth,1999,197:635-640
44 费业泰。误差理论与数据处理。北京:机械工业出版社。1995:34-54
45 Peters W H,Ranson W F.Digital imaging techniques in experimental stress analysis[J].Opt Eng,1981,21:427-431
46 Schreier W S,Braasch J R,Sutton M A.Systematic errors in digital image correlation caused by intensity interpolation[J].optEng,2000,39(11):2915-2921.
47 强西林,高鸣,卢进军。便携式镀膜玻璃光学透过率测定仪。西安工业学院,应用光学。第16卷 第1期 1995年