复杂瞬态注入波形等效简化方法研究
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- 英文论文题名：Research on the Equivalent Simplification Method of the Complex Transient Injection Waveform
- 论文作者：潘晓东 ; 魏光辉 ; 卢新福 ; 万浩江 ; 范丽思
- 英文论文作者：PAN Xiao-dong ; WEI Guang-hui ; LU Xin-fu ; WAN Hao-jiang ; FAN Li-si ; Institute of Electrostatic and Electromagnetic Protection ; Ordnance Engineering College
- 年：2015
- 作者机构：军械工程学院静电与电磁防护研究所;
- 论文关键词：电磁脉冲 ; 复杂波形 ; 差模注入 ; 等效简化 ; 试验方法
- 英文论文关键词：electromagnetic pulse ; complex waveform ; differential mode injection ; equivalent simplification ; test method
- 会议召开时间：2015-08-12
- 会议录名称：静电放电：从地面新技术应用到空间卫星安全防护—中国物理学会第二十届全国静电学术会议论文集
- 语种：中文
- 分类号：E919
- 学会代码：WLJD
- 会议名称：静电放电 ; 从地面新技术应用到空间卫星安全防护—中国物理学会第二十届全国静电学术会议
- 会议地点：中国河北石家庄
- 主办单位：中国物理学会静电专业委员会
- 学会名称：中国物理学会静电专业委员会
- 页数：8
- 文件大小：846k
- 原文格式：D
- 会议级别：全国
摘要
针对电磁脉冲差模定向注入等效替代瞬态强场电磁辐射效应试验的技术需求,提出了复杂瞬态注入波形"效应特征参量"的概念,理论分析了各效应特征参量对武器装备干扰和损伤效应的影响,给出了复杂瞬态注入波形等效简化的原则,提出了不带载波和带载波的两类复杂瞬态注入波形的等效简化方法,确定将梯形波或方波脉冲(含带载波)作为等效简化注入波形。在此基础上,以某型数据链收发系统为受试对象,开展了电磁脉冲差模定向注入等效替代超宽带电磁脉冲辐射效应试验,试验结果表明:在超宽带电磁脉冲辐射和等效方波脉冲注入试验条件下,受试系统的干扰恢复时间基本相同,试验结果验证了电磁脉冲差模定向注入等效试验方法以及复杂瞬态注入波形等效简化方法的有效性。
According to the requirements of electromagnetic pulse differential mode directional injection equivalent of transient high intensity electromagnetic radiation effects testing technique,a new concept of effect characteristic parameter of the complex transient injection waveform is proposed.The influence on the interference and damage effects of the weapon system caused by the effect characteristic parameter is analyzed theoretically.The equivalent simplification principle of the complex transient injection waveform is given.The equivalent simplification methods of the complex transient injection waveform with carrier or without carrier are put forward separately.The trapezoidal wave and square wave pulse which may include carrier are confirmed to be the equivalent simplification injection waveform.On the basis above,the certain type data link transmit-receive system is selected as EUT.The electromagnetic pulse differential mode directional injection equivalent of ultra-wide band electromagnetic pulse radiation effect tests are carried out.The test results indicate that the interference recovery time is almost the same under the condition of the ultra-wide band electromagnetic pulse radiation and the equivalent square wave pulse injection.Therefore,the test results verify the effectiveness of the electromagnetic pulse differential mode directional injection test method and the equivalent simplification method of the complex transient injection waveform.
According to the requirements of electromagnetic pulse differential mode directional injection equivalent of transient high intensity electromagnetic radiation effects testing technique,a new concept of effect characteristic parameter of the complex transient injection waveform is proposed.The influence on the interference and damage effects of the weapon system caused by the effect characteristic parameter is analyzed theoretically.The equivalent simplification principle of the complex transient injection waveform is given.The equivalent simplification methods of the complex transient injection waveform with carrier or without carrier are put forward separately.The trapezoidal wave and square wave pulse which may include carrier are confirmed to be the equivalent simplification injection waveform.On the basis above,the certain type data link transmit-receive system is selected as EUT.The electromagnetic pulse differential mode directional injection equivalent of ultra-wide band electromagnetic pulse radiation effect tests are carried out.The test results indicate that the interference recovery time is almost the same under the condition of the ultra-wide band electromagnetic pulse radiation and the equivalent square wave pulse injection.Therefore,the test results verify the effectiveness of the electromagnetic pulse differential mode directional injection test method and the equivalent simplification method of the complex transient injection waveform.
引文
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[18]方进勇,申菊爱,杨志强,等.集成电路器件微波损伤效应实验研究[J].强激光与粒子束,2003,15(6):591-594.FANG Jinyong,SHEN Juai,YANG Zhiqiang,et al.Experimental study on microwave vulnerabi lity effect of integrated circuit[J].High Power Laser&Particle Beams,2003,15(6):591-594.
[2]C.R.Miller.Electromagnetic pulse threats in 2010[R].USA:Center for Strategy and Technology,Air War College,Air University,2005.
[3]潘晓东.差模定向注入等效替代强场电磁辐射效应试验技术[D].石家庄:军械工程学院,2014.PAN Xiaodong.Differential mode directional injection equivalent of high intensity electromagnetic radiation effects testing technique[D].Shijiazhuang:Ordnance Engineering College,2014.
[4]潘晓东,魏光辉,卢新福,等.电磁注入等效替代辐照理论模型及实现技术[J].高电压技术,2012,38(9):2293-2301.PAN Xiaodong,WEI Guanghui,LU Xinfu,et al.Theoretical model and implementation technique of using injection as a substitute for radiation[J].High Voltage Engineering,2012,38(9):2293-2301.
[5]刘尚合,武占成,朱长清,等.静电放电及危害防护[M].北京:北京邮电大学出版社,2004.LIU Shanghe,WU Zhancheng,ZHU Changqing,et al.Electrostatic discharge and hazard protection[M].Beijing:Beijing university of posts and telecommunications publishing house,2004.
[6]刘尚合,魏光辉,刘直承,等.静电理论与防护[M].北京:兵器工业出版社,1999.LIU Shanghe,WEI,Guanghui,LIU Zhicheng,et al.Electrostatic theory and protection[M].Beijing:Weapons industry press,1999.
[7]方进勇,刘国至,李平,等.高功率微波脉冲宽度效应试验研究[J].强激光与粒子束,1999,11(5):639-642.FANG Jinyong,LIU Guozhi,LI Ping,et al.Experimental study of the high power microwave pulse width effect[J].High Power Laser&Particle Beams,1999,11(5):639-642.
[8]GJB548B-2005.微电子器件试验方法和程序[S].2005.GJB548B-2005.The test method and procedure of microelectronic device[S].2005.
[9]GJB128A-1997.半导体分立器件试验方法[S].1997.GJB128A-1997.The test method of semiconductor discrete devices[S].1997.
[10]乔登江,周绍文,潘虎等.电子元器件电磁脉冲效应手册[M].内部资料,1992:28.QIAO Dengjiang,ZHOU Shaowen,PAN Hu,et al.The handbook of electormagnetic pulse effects for electronic components[M].Internal materials,1992:28.
[11]孙永卫.强电磁脉冲对无线电引信的作用机理研究[D].石家庄:军械工程学院,2003.SUN Yongwei.Study on the influencing mechanism of strong electromagnetic pulse on radio fuze[D].Shijiazhuang:Ordnance Engineering College,2003.
[12]汪海洋.高功率微波效应机理理论与实验研究[D].成都:电子科技大学,2010.WANG Haiyang.Research on the effects mechanism theory and experiments of high power microwave.Chengdu:University of Electronic Science and Technology of China,2010.
[13]生芳.高功率微波对电子器件损伤的初步研究[D].沈阳:沈阳理工大学,2007.SHENG Fang.Preliminary research on the electronic device damage caused by high power microwave.Shenyang:Shenyang Ligong University,2007.
[14]M.G.Backstrom,K.G.Lovstrand.Susceptibility of electronic systems to high-power microwaves:summary of test experience[J].IEEE Trans.Electromagn.Compat.,2004,46(3):396-403.
[15]周璧华,石立华,高成.电磁脉冲场对典型微电子设备干扰与损伤效应的实验研究[C].2004年全国通信防雷技术研讨会论文集,南京,2004:11-16.ZHOU Bihua,SHI Lihua,GAO Cheng.The experiment research on typical microelectronic equipment interference and damage for electromangetic pulse field[C].The 2004 national symposium on lighting protection technology for communication.Nanjing,2004:11-16.
[16]M.Camp,H.Garbe.Susceptibility of personal computer systems to fast transient electromagnetic pulses[J].IEEE Trans.Electromagn.Compat.,2006,48(4):829-833.
[17]王韶光.无线电引信超宽带辐照效应及防护加固研究[D].石家庄:军械工程学院,2008.WANG Shaoguang.The research on UWBradiation effects and protection methods for radio fuze[D].Shijiazhuang:Ordnance Engineering College,2008.
[18]方进勇,申菊爱,杨志强,等.集成电路器件微波损伤效应实验研究[J].强激光与粒子束,2003,15(6):591-594.FANG Jinyong,SHEN Juai,YANG Zhiqiang,et al.Experimental study on microwave vulnerabi lity effect of integrated circuit[J].High Power Laser&Particle Beams,2003,15(6):591-594.