电子探针分析技术进展及面临的挑战
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摘要
电子探针是研究地球与行星物质组成最基础的微束分析技术。近年来,固体地球科学和行星科学的不断发展,促使电子探针分析技术取得了一系列进展:矿物微量元素分析、稀土矿物测试方法完善、副矿物定年、富Fe矿物/熔体Fe~(3+)含量测定、场发射电子探针及软X射线分析谱仪的开发及应用等。同时,电子探针分析技术也面临着诸多挑战:微量元素测试在降低检测限的同时,还需要提高分析的准确度和精确度;降低二次荧光效应的影响;场发射电子探针在低电压下需要建立全新的分析条件和校正方式。基于这些挑战,电子探针未来在微量元素监测标样开发、二次荧光效应校正、场发射电子探针及软X射线分析谱仪应用、波谱仪完善和微区多种分析技术集成等方面具有发展潜力,以便为地学样品的研究提供更丰富、更准确的微米尺度成分信息。
Electron probe microanalysis( EPMA) is a fundamental analysis technique for the study of the Earth and planets materials. In the last decades,EPMA has been developed from its essential capacity of analyzing major elements for minerals to a series of innovative technologies,including trace-element analyses in crucial minerals,precise analysis of rare-earth minerals,chemical dating of accessory minerals,Fe~(3+)determination in Fe-rich minerals,and applications of field-emission gun EPMA( FEG-EPMA) and soft X-ray emission spectrometer( SXES). However,there are still many challenges in such innovative technologies as follows:( 1)how to lower detection limit and improve the precision and accuracy;( 2) how to eliminate the influence of the secondary fluorescence effect;( 3) establishing new analytical and correction methods under low accelerating voltage conditions by using FEG-EPMA. EPMA analyses are expected to have great potentials involving the development of reference standards, secondary fluorescence effect correction,broad applications of FEG-EPMA and soft X-ray emission spectrometer,improvement of spectrometer and integration of multiple microbeam techniques. Therefore,EPMA would provide further abundant and accurate micron-scale information for geological samples.
Electron probe microanalysis( EPMA) is a fundamental analysis technique for the study of the Earth and planets materials. In the last decades,EPMA has been developed from its essential capacity of analyzing major elements for minerals to a series of innovative technologies,including trace-element analyses in crucial minerals,precise analysis of rare-earth minerals,chemical dating of accessory minerals,Fe~(3+)determination in Fe-rich minerals,and applications of field-emission gun EPMA( FEG-EPMA) and soft X-ray emission spectrometer( SXES). However,there are still many challenges in such innovative technologies as follows:( 1)how to lower detection limit and improve the precision and accuracy;( 2) how to eliminate the influence of the secondary fluorescence effect;( 3) establishing new analytical and correction methods under low accelerating voltage conditions by using FEG-EPMA. EPMA analyses are expected to have great potentials involving the development of reference standards, secondary fluorescence effect correction,broad applications of FEG-EPMA and soft X-ray emission spectrometer,improvement of spectrometer and integration of multiple microbeam techniques. Therefore,EPMA would provide further abundant and accurate micron-scale information for geological samples.
引文
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