摘要
利用溶胶-凝胶旋涂工艺在普通玻璃基底上生长本征ZnO薄膜和Mg_xZn_(1-x)O复合薄膜.采用X射线衍射仪(XRD)、紫外可见分光光度计(UV-vis)、光致发光(PL)等测试手段对样品进行表征,分别对半导体合金薄膜的晶格参数与结构、结晶质量、光学透过率及其禁带宽度进行分析与研究.比较Mg_xZn_(1-x)O薄膜与本征ZnO薄膜的XRD图谱后发现,Mg元素可提高薄膜的结晶质量,但是复合薄膜的c轴择优取向没有因为Mg元素的引入而得到改善.随着Mg元素掺杂量的增加,Mg_xZn_(1-x)O(x=0.10、0.20、0.30)复合薄膜的带隙随之变宽,薄膜组分为Mg0.20Zn0.80O和Mg0.30Zn0.70O时,光致发光谱中出现了强度较大的紫外发光峰,组分为Mg0.20Zn0.80O薄膜的带隙展宽效果较为明显且光学透过率较优.
Intrinsic ZnO thin films and Mg_xZn_(1-x)O thin films were prepared on glass substrate by solgel technique adopting spin coating process.The lattice parameters,structure and crystal quality,photoluminescence and transmission properties were investigated by X-ray diffraction(XRD),photoluminescence(PL)and UV-Vis spectrophotometer(UV).Comparing XRD patterns of Mg_xZn_(1-x)O films and intrinsic ZnO thin films,Mg element can improve the quality of the crystallization of the thin film,but the c-axis preferred orientation of composite membrane was not improved by the introduction of Mg element.With the increase of the amount of doping Mg element,the band gaps of Mgx Zn1-xO(x=0.1,0.2,0.3)composite films are widened.The UV emission peak with high intensity appeared in the photoluminescence spectra of Mg0.2 Zn0.8 O and Mg0.3 Zn0.7 O,and the Mg0.2 Zn0.8 O film owns the relatively wide band gap and the higher optical transmittance.
引文
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