电容近炸引信高频部件储存性能试验研究
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摘要
对实际非密封储存2、4、6～12年的引信高频部件进行储存性能检测试验,结果表明,高频部件失效存在振荡电压峰峰值降低失效和检波电压降低失效两种;从储存第6年开始出现失效,储存6～12年分别失效4、5、7、10、7、6、10发;振荡电压峰峰值和检波电压均值均有下降趋势,但振荡频率和饱和检波电压未失效。
This paper carried out storage performance test on fuze high-frequency components of actual unsealed storage for 2,4,6 ～ 12 years. The results show that there are two phenomena of high frequency component failure,such as peaking and lowering of oscillating voltage and failure of detection voltage.Failure occurred from the sixth year of storage,and 4,5,7,10,7,6,and 10 failures were stored for 6 to 12 years. The mean value of peak value of oscillating voltage and detection voltage have a downward trend,but the oscillation frequency and the saturation detection voltage have not failed.
This paper carried out storage performance test on fuze high-frequency components of actual unsealed storage for 2,4,6 ～ 12 years. The results show that there are two phenomena of high frequency component failure,such as peaking and lowering of oscillating voltage and failure of detection voltage.Failure occurred from the sixth year of storage,and 4,5,7,10,7,6,and 10 failures were stored for 6 to 12 years. The mean value of peak value of oscillating voltage and detection voltage have a downward trend,but the oscillation frequency and the saturation detection voltage have not failed.
引文
[1]吴英伟,齐杏林,王洪岩,等.典型电容近炸引信储存性能退化分析[J].装备环境工程,2018,15(2):63-67.
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[4]吴英伟.典型电容近炸引信储存性能试验与寿命预测研究[D].石家庄:军械工程学院,2016.
[5]郑波,李明,杨宝强,等.阵地环境下引信贮存可靠性研究[J].探测与控制学报,2003,25(3):51-53.
[6]高萌,王金柱,何学广.基于可靠性统计分析法的制导弹药储存寿命评估[J].装备环境工程,2013,10(4):110-113.
[7] GJB166—86.引信制造与验收技术条件[S]. 1986.
[8]王洪岩,齐杏林,吴英伟.迫弹电容近炸引信储存性能检测试验方法研究[C]//18011制导与引信信息网学术交流会论文集(引信分册). 2018:290-297.
[9]吴英伟,齐杏林,郑波.引信典型电子部件长储性能加速退化试验方法[J].探测与控制学报,2016,38(4),20-23.
[10]任亮亮,库存电容近炸引信电性能通用检测系统设计[D].石家庄:军械工程学院,2010.
[11]赵宁.可靠性数据分析[M].北京:国防工业出版社,2011.
[2]李彦学,智墩旺.无线电与电子时间引信[M].北京:兵器工业出版社,1996.
[3]刘爽,白玉贤.耦合式电容近炸引信电极设计与电容分析[J].四川兵工学报,2010,31(1):52-53.
[4]吴英伟.典型电容近炸引信储存性能试验与寿命预测研究[D].石家庄:军械工程学院,2016.
[5]郑波,李明,杨宝强,等.阵地环境下引信贮存可靠性研究[J].探测与控制学报,2003,25(3):51-53.
[6]高萌,王金柱,何学广.基于可靠性统计分析法的制导弹药储存寿命评估[J].装备环境工程,2013,10(4):110-113.
[7] GJB166—86.引信制造与验收技术条件[S]. 1986.
[8]王洪岩,齐杏林,吴英伟.迫弹电容近炸引信储存性能检测试验方法研究[C]//18011制导与引信信息网学术交流会论文集(引信分册). 2018:290-297.
[9]吴英伟,齐杏林,郑波.引信典型电子部件长储性能加速退化试验方法[J].探测与控制学报,2016,38(4),20-23.
[10]任亮亮,库存电容近炸引信电性能通用检测系统设计[D].石家庄:军械工程学院,2010.
[11]赵宁.可靠性数据分析[M].北京:国防工业出版社,2011.