摘要
金属反射层次临界装置和含氢反射层次临界装置的瞬发中子衰减特性不相同,对测量信号处理得到的时间常数的物理意义需深入认识。研究分析认为,对快谱装置而言,自引入稠密等离子体聚焦(DPF)源中子时刻起,装置能谱基本不变,时间常数本征值概念和数值计算的本征值均适用于快谱装置的研究,数值计算的时间常数本征值可与实验测量的时间常数进行比较。但是,对含氢反射层装置而言,自引入DPF源中子时刻起,装置的能谱一直随时间发生变化没有达到稳态,不满足时间常数本征值的定义,不能用于诊断装置瞬发中子特性,对于关心瞬发中子特性的研究命题,时间常数本征值不适用。
It is founded that the prompt neutron decay characteristics of the metal reflection layer subcritical device and prompt neutron decay characteristics of the hydrogen reflection subcritical device are not the same. For the fast spectrum device, after the DPF neutron source is induced into the device, the energy spectrum of the device will be basically unchanged, the time constant of the eigenvalue calculation concept and numerical eigenvalue can be applied to research the fast spectrum device, and the numerical calculation of time constant eigenvalues will be same with the experimental measurements for comparison. However, for the hydrogen reflective layer device, the energy spectrum will changed till reaching the steady state of the device, based on the definition of eigenvalue, the energy spectrum of the hydrogen reflector device reached steady state within 10 milliseconds or longer, the longer the more information can slow neutron the spectrum, so the eigenvalue is not applicable for hydrogen reflector device.
引文
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