用户名: 密码: 验证码:
IP板对中/高能X/γ射线响应特性研究
详细信息    查看全文 | 推荐本文 |
  • 英文篇名:Study on Response Characteristic of Imaging Plate for X/γ-ray with Middle/High Energy
  • 作者:黄建微 ; 党永乐 ; 李德红 ; 王乃彦 ; 朱治钢
  • 英文作者:HUANG Jian-wei;DANG Yong-le;LI De-hong;WANG Nai-yan;ZHU Zhi-gang;National Institute of Metrology;College of Nuclear Science and Technology,Beijing Normal University;China Institute of Atomic Energy;China Nuclear Power Engineering Co.,Ltd.;
  • 关键词:IP板 ; 中/高能X/γ射线 ; 能量响应 ; 衰退效应
  • 英文关键词:imaging plate;;X/γ-ray with middle/high energy;;energy response;;fading effect
  • 中文刊名:YZJS
  • 英文刊名:Atomic Energy Science and Technology
  • 机构:中国计量科学研究院;北京师范大学核科学与技术学院;中国原子能科学研究院;中国核电工程有限公司;
  • 出版日期:2017-06-27 15:04
  • 出版单位:原子能科学技术
  • 年:2017
  • 期:v.51
  • 基金:中国计量科学研究院基本科研业务费资助项目(25-AKY1623)
  • 语种:中文;
  • 页:YZJS201710024
  • 页数:6
  • CN:10
  • ISSN:11-2044/TL
  • 分类号:158-163
摘要
为了实验得到IP板对中/高能X/γ射线的响应,基于X射线装置和~(137)Cs、~(60)Co放射源研究了IP板对40keV~1.33 MeV范围内的X/γ射线的响应。利用IP板的物理模型和蒙特卡罗方法对IP板的响应进行了计算和模拟,两者的结果与实验结果符合较好。基于X/γ射线在IP板感光层中的沉积效率,研究了IP板对X/γ射线沉积的灵敏度响应,理论计算结果与实验结果亦符合较好。本文研究结果为将IP板应用于中/高能X/γ射线测量提供了数据支撑和技术基础。
        In order to obtain the response of imaging plates(IPs)for X/γ-ray with middle/high energy through experiments,the sensitivity of IPs for incident X/γ-ray in the range from 40 keV to 1.33 MeV was studied based on X-ray device and radiation source ~(137)Cs and ~(60)Co.The sensitivity of IPs was studied and simulated by physical model and Monte Carlo method,and the results are in good agreement with the experimental results.Besides,based on the deposition efficiency of X/γ-ray in the IPs photosensitive layer,the sensitivity of IPs for absorbed X/γ-ray was studied,and the theoretical calculation result is in good agreement with the experimental result.The result of this study provides a data support and technical basis for the application of IPs in X/γ-ray with middle/high energy measurement.
引文
[1]AMEMIYA Y,MIYAHARA J.Imaging plate illuminates many fields[J].Nature,1988,336(6194):89-90.
    [2]陈朝,李仓敏,贾铎默.IP板研究现状与前景展望[J].影像技术,2011,23(3):3-7.CHEN Chao,LI Cangmin,JIA Duomo.Research status and prospects of imaging plate[J].Image Technology,2011,23(3):3-7(in Chinese).
    [3]GONZALEZ A L,LI H,MITCH M,et al.Energy response of an imaging plate exposed to standard beta sources[J].Applied Radiation&Isotopes,2002,57(6):875-882.
    [4]陈波.BaFX成像板的辐射探测特性及其在总α测量中的应用[D].上海:复旦大学,2011.
    [5]TANAKA K A,YABUUCHI T,SATO T,et al.Calibration of imaging plate for high energy electron spectrometer[J].Review of Scientific Instruments,2004,76(1):013507.
    [6]CHEN H,BACK N L,BARTAL T,et al.Absolute calibration of image plates for electrons at energy between 100keV and 4 MeV[J].Review of Scientific Instruments,2008,79(3):033301.
    [7]MEADOWCROFT A L,BENTLEY C D,STOTT E N.Evaluation of the sensitivity and fading characteristics of an image plate system for X-ray diagnostics[J].Review of Scientific Instruments,2008,79(11):113102.
    [8]KESSLER C,BURNS D T,LI D,et al.Key comparison BIPM.RI(I)-K5 of the air kerma standards of the NIM,China,and the BIPM in Cs gamma radiation[J].Metrologia,2015,52(1A):06009.
    [9]葛双.20~300kV X射线参考辐射场的建立和研究[D].衡阳:南华大学,2016.
    [10]YAMADERA A,KIM E,MIYATA T,et al.Property test of imaging plate as X-and gammaray personal dosimeter[J].Radioisotopes,1993,42(12):676-682.
    [11]TANIYAMA A,SHINDO D,OIKAWA T.Detective quantum efficiency of the 25μm pixel size imaging plate for transmission electron microscopes[J].Microscopy,1997,46(4):303-310.
    [12]OIKAWA T,SHINDO D,HIRAGA K.Fading characteristic of imaging plate for a transmission electron microscope[J].Journal of Electron Microscopy,1994,43(6):402-405.
    [13]SIBANDA T,UZUNER O.Functional equation for the fading correction of imaging plates[J].Progress in Neurobiology,2000,450(2-3):343-352.
    [14]SEELENTAG W W,武全德.过滤X射线韧致辐射谱的等效半值层和平均能量[J].现代测量与实验室管理,1981(3):60-63.SEELENTAG W W,WU Quande.The equivalent half value layer and average energy of X ray bremsstrahlung spectrum[J].Modern Measurement and Laboratory Management,1981(3):60-63(in Chinese).

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700