Traceable Thermoelectric Measurements of Seebeck Coefficients in the Temperature Range from 300 K to 900 K

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• 作者：Ernst Lenz (1)
  Frank Edler (1)
  Pawel Ziolkowski (2)
  
• 关键词：Figure of merit ; Reference material ; Seebeck coefficient ; Traceable measurement
• 刊名：International Journal of Thermophysics
• 出版年：2013
• 出版时间：October 2013
• 年：2013
• 卷：34
• 期：10
• 页码：1975-1981
• 全文大小：
• 作者单位：Ernst Lenz (1)
  Frank Edler (1)
  Pawel Ziolkowski (2)
  
  1. Physikalisch-Technische Bundesanstalt, Abbestrae 2-12, 10587, Berlin, Germany
  2. Deutsches Zentrum f Luft- und Raumfahrt e.V., Linder Hhe, 51147, Kln, Germany
  
• ISSN：1572-9567

文摘

This work is focused on the characterization of thermoelectric reference materials with traceable Seebeck coefficients in the temperature range from 300 K to 900 K. The presented measurement system will provide a relative uncertainty of the measurement of the Seebeck coefficient of about 5%. The Seebeck coefficient represents an important component of the figure of merit ZT and thus the low uncertainty of the Seebeck coefficient will also lower the uncertainty of the ZT value. We also present data which lead to the launch of the certification process of a NiCu-alloy according to the ISO Guide 35.