Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope
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- 作者：JianQiang Yu (1)
JingHe Yuan (1)
XueJie Zhang (1)
JianLi Liu (1)
XiaoHong Fang (1) - 关键词：stimulated emission depletion (STED) microscope ; atomic force microscope (AFM) ; confocal microscope ; integrated imaging ; super ; resolution imaging
- 刊名：Chinese Science Bulletin
- 出版年：2013
- 出版时间：November 2013
- 年：2013
- 卷：58
- 期：33
- 页码：4045-4050
- 全文大小：
- 作者单位：JianQiang Yu (1)
JingHe Yuan (1)
XueJie Zhang (1)
JianLi Liu (1)
XiaoHong Fang (1)
1. Beijing National Laboratory for Molecular Sciences, Key Laboratory of Molecular Nanostructure and Nanotechnology, Institute of Chemistry, Chinese Academy of Sciences, Beijing, 100190, China - ISSN：1861-9541
文摘
We have built an integrated imaging system by combining stimulated emission depletion (STED) microscope and atomic force microscope (AFM). The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of 42 nm was achieved. With this integrated imaging system, morphological features, mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples. This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.