Polarization-Dependent Raman Spectroscopy of Epitaxial TiO2(B) Thin Films

详细信息    查看全文

• 作者：Jacob R. Jokisaari ; Dylan Bayerl ; Kui Zhang ; Lin Xie ; Yuefeng Nie ; Darrell G. Schlom ; Emmanouil Kioupakis ; George W. Graham ; Xiaoqing Pan
• 刊名：Chemistry of Materials
• 出版年：2015
• 出版时间：December 8, 2015
• 年：2015
• 卷：27
• 期：23
• 页码：7896-7902
• 全文大小：462K
• ISSN：1520-5002

文摘

The bronze polymorph of titanium dioxide, known as TiO<sub>2sub>(B), has promising photochemical and electronic properties for potential applications in Li-ion batteries, photocatalysis, chemical sensing, and solar cells. In contrast to previous studies performed with powder samples, which often suffer from impurities and lattice water, here we report Raman spectra from highly crystalline TiO<sub>2sub>(B) films epitaxially grown on Si substrates with a thin SrTiO<sub>3sub> buffer layer. The reduced background from the Si substrate significantly benefits acquisition of polarization-dependent Raman spectra collected from the high-quality thin films, which are compared to nanopowder results reported in the literature. The experimental spectra were compared with density functional theory calculations to analyze the atomic displacements associated with each Raman-active vibrational mode. These results provide a standard reference for further investigation of the crystallinity, structure, composition, and properties of TiO<sub>2sub>(B) materials with Raman spectroscopy.