Abnormal dielectric behavior induced by defect dipoles in aged Na0.5Bi0.5(Ti,Zr)O3 thin film
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- 作者：Changhong Yanga ; b ; yang_changhong@163.com" class="auth_mail" title="E-mail the corresponding author ; Qian Yaoa ; Huiyi Guoa ; Fangjuan Genga ; Panpan Lva ; Chao Fenga
- 关键词：Thin film ; Aging ; Microstructure ; Dielectric behavior
- 刊名：Materials Letters
- 出版年：2016
- 出版时间：1 February 2016
- 年：2016
- 卷：164
- 期：Complete
- 页码：380-383
- 全文大小：1541 K
文摘
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The microstructures of both fresh and aged NBTZr samples are almost similar.
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The aged NBTZr thin film shows an abnormal εr (tan δ)–E loop with four peaks.
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With increasing Ea or decreasing frequency, the defect dipoles are broken gradually.
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The aging degree is strongly dependent on the stability of ferroelectric domain.
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