Investigation of nanocrystalline thin cobalt films thermally evaporated on Si(100) substrates

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• 作者：W. Kozłowski^a ; ^{wkozl@std2.phys.uni.lodz.pl} ; J. Balcerski^a ; W. Szmaja^a ; I. Piwoński^b ; D. Batory^c ; E. Miękoś^d ; M. Cichomski^b
• 关键词：Thin cobalt films ; Magnetic domain structure ; Morphological structure ; Scanning probe microscopy ; Scanning electron microscopy
• 刊名：Journal of Magnetism and Magnetic Materials
• 出版年：2017
• 出版时间：15 March 2017
• 年：2017
• 卷：426
• 期：Complete
• 页码：108-113
• 全文大小：728 K
• 卷排序：426

文摘

100 nm thick nanocrystalline cobalt films on Si(100) were studied quantitatively. The grains are densely packed and possess the average size (35.6±0.8) nm. The films have a texture with the hexagonal axis perpendicular to the film surface. The magnetic domains form a maze stripe pattern with the average size (102±6) nm. The domains are magnetized almost perpendicularly to the film surface.