Passivation of pinhole defect microelectrode arrays in ultrathin silica films immobilized on gold substrates

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• 作者：Piotr Macech ; Jeanne E. Pemberton
• 关键词：Insulating overlayer ; Pinhole defect ; Microelectrode array ; Atomic force microscopy ; Fourier transform infrared spectroscopy ; Silica ; Electropolymerization ; Poly(phenylene) oxide
• 刊名：Thin Solid Films
• 出版年：2009
• 出版时间：31 July 2009
• 年：2009
• 卷：517
• 期：18
• 页码：5399-5403
• 全文大小：773 K

文摘

Nanoscopic defects present in ultrathin (~ 6 nm) silica films covalently attached to gold substrates through a gold oxide layer exhibit a voltammetric response consistent with a random array of ultramicroelectrodes. These pinholes can be passivated via electrochemical polymerization of phenol to create insulating poly(phenylene) oxide plugs as documented by atomic force microscopy and infrared reflectance-absorbance spectroscopy. Passivation of pinholes is ~ 99.5 % complete after 550 voltammetric cycles of oxidative electropolymerization.