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Direct synchrotron x-ray measurements of local strain fields in elastically and plastically bent metallic glasses
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文摘
In situ high-energy synchrotron X-ray diffraction was conducted on elastically and plastically bent bulk metallic glass (BMG) thin plates, from which distinct local elastic strain fields were mapped spatially. These directly measured residual strain fields can be nicely interpreted by our stress analysis, and also validate a previously proposed indirect residual-stress-measurement method by relating nanoindentation hardness to residual stresses. Local shear strain variations on the cross sections of these thin plates were found in the plastically bent BMG, which however cannot be determined from the indirect indentation method. This study has important implications in designing and manipulating internal strain fields in BMGs for the purpose of ductility enhancement.

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