Effect of metal layer stacking order on the growth of Cu₂ZnSnS₄thin films

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• 作者：Narayana Thota^a ; M. Gurubhaskar^a ; M. Anantha Sunil^b ; P. Prathap^c ; Y.P. Venkata Subbaiah^a ; ^d ; ^{subbaiahy@gmail.com} ; Ashutosh Tiwari^d
• 关键词：Cu2ZnSnS4 thin films ; Two step growth ; Sulfurization ; Raman mapping ; X-ray photo electron spectroscopy
• 刊名：Applied Surface Science
• 出版年：2017
• 出版时间：28 February 2017
• 年：2017
• 卷：396
• 期：Complete
• 页码：644-651
• 全文大小：2764 K
• 卷排序：396

文摘

CZTS thin films were prepared using sequential sputtering followed by sulfurization. Examined the effect of stacking order on properties of CZTS films after sulfurization. Material losses and phase evolution during high temperature sulfurization depends on stacking sequence. The films were characterized by XRD, Raman, FE-SEM with EDS, XPS, UV–vis–NIR spectrophotometer and Electrical study. Raman mapping was collected to ensure uniformity of the CZTS thin film.