• 责任者：Li Yichao (Department of Oilfield Management ; SINOPEC ; Beijing 100029 ; China) ; Li Chunshan
• 刊名：Acta Petrologica et Mineralogica
• 出版年：2009
• 卷期：28(1)
• 关键词：X射线荧光光谱 ; X-ray fluorescence spectra ; 录井 ; mud logging
• 页码：p.58-68
• 图表：5 illus., 5 tables, 13 refs.
• 分类号：1003
• issnNo：ISSN1000-6524
• isbnNo：CN11-1966/P

The authors analyzed chemical characteristics and differences between sedimentary rocks, and the results obtained have established the application basis for X-ray fluorescence(XRF) analysis in logging, which is a new logging technique called XRF-logging. The differences in lithologic characters and thicknesses of strata provide a prerequisite for the stratigraphic analysis with the XRF-Logging technique. It is proposed in this paper that the decimeter should be used as the criterion of the lower sampling limit for the XRF-logging technique. A practical procedure for identifying lithologic character and judging horizons using the XRF-logging technique is illustrated in this paper, and a prediction of the application vista of the XRF-logging technique is also given. It is pointed out that the main element database of sedimentary rocks and stratigraphic profiles should be established for further application of the XRF-logging technique.oft-com:office:office" />